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Bilde av Johansen, Jarle André
Bilde av Johansen, Jarle André
Department of Automation and Process Engineering jarle.johansen@uit.no +4777660366 95724923 Tromsø You can find me here

Jarle André Johansen

Job description

Førsteamanuensis ved ingeniørstudiet i automasjon ved Institutt for ingeniørvitenskap og sikkerhet.

  • Hui, Bjørn-Morten, Puneet, Jarle André, Dilip K. :
    Biosignal-Based Driving Skill Classification Using Machine Learning: A Case Study of Maritime Navigation
    Applied Sciences 2021 DOI / ARKIV
  • Jarle André, Bernt Inge :
    Experimental results on the pressure dependence of the minnaert resonance frequency for three different gases in water
    Proceedings - IEEE Ultrasonics Symposium 2015 DOI
  • Yngve, Jarle André, Alfred :
    High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
    European Signal Processing Conference 2015 DOI
  • Bernt Inge, Jarle André :
    Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
    Proceedings - IEEE Ultrasonics Symposium 2011 DOI
  • Jarle Andre, Zhenrong, John D., Y, G, Q et al.:
    On the scaling limits of low-frequency noise in SiGe HBTs
    Solid-State Electronics 2004 DOI
  • Jarle Andre, Zhenrong, John D., Y, G, Q et al.:
    On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
    Solid-State Electronics 2004
  • Zhenrong, Jarle Andre, John D., Robert A., Paul W., Alvin J. :
    Using proton irradiation to probe the origins of low-frequency noise variations in SiGeHBTs
    IEEE Transactions on Nuclear Science 2004
  • Xuyuan, Jarle Andre, Cora, Arthur D. Van :
    On low-frequency noise of polycrystalline GeSi for sub-micron CMOS technologies
    Solid-State Electronics 2001
  • Xuyuan, Jarle Andre, Arthur D. Van, Cora :
    On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies”
    Solid-State Electronics 2000
  • Jarle André, Kåre, Puneet, Hassan Abbas :
    Measuring the Sea Spray Flux using High-Speed Camera
    2015 ARKIV
  • Bernt Inge, Jarle André :
    Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
    2011
  • Jarle Andre, Peng :
    Model-Based Low-Frequency Noise Power Spectrum Density Fitting in SiGe HBTs
    2007 SAMMENDRAG / OMTALE
  • Jarle Andre :
    Low-frequency noise characterization of silicon-germanium resistors and devices
    UiT Norges arktiske universitet 03. junio 2004
  • Jarle Andre, Yngve, Zhenrong, John D. :
    A Statistical Tool For Probing the Coupling Between Noisy Traps in Semiconductor Devices, With Application to 1/f Noise in SiGe HBTs
    2004
  • Yngve, Jarle Andre, Alfred :
    High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
    2004
  • Jarle Andre :
    Lavfrekevnt støy i Silisium-Germanium transistorer
    2004
  • Yngve, Alfred, Jarle Andre :
    High-precision surrogate based tests for gaussianity and linearity
    2004
  • Yngve, Jarle Andre, John D., Zhenrong :
    A statistical tool for probing the coupling between noisytraps in semiconductor devices, with application to 1/f noise in SiGe HBTs
    2004
  • Zhenrong, Jarle Andre, John D., Robert A., Paul W., Alvin J. :
    Using Proton Irradiation to Probe the Origins of Low-frequency Noise Variations in SiGe HBTs
    2003
  • Yngve, Alfred, Jarle Andre, Arthur D. van, John D. :
    Time series analysis of low-frequency noise in SiGe HBTs
    2003
  • Yngve, Jarle Andre, Alfred, John D., Arthur D. Van :
    Time Series Analysis of Low-Frequency Noise in SiGe HBTs
    2003
  • Chendong, Qingqing, Ragad, John D., Alvin J., Jarle Andre et al.:
    An Investigation of the Damage Mechanism in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs
    2003
  • Jarle Andre, Zhenrong, John D., Alvin J. :
    Geometry-Dependent Low-frequency Noise Variations in 120 GHz fT SiGe HBTs
    2003
  • Jarle Andre, Zhenrong, John D., Yan, Guofu, Qingqing et al.:
    On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
    2003
  • Xuyuan, Jarle Andre, C. L. :
    Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers
    2001
  • Jarle Andre, Hallvar, Xuyuan, Arthur D. Van, Cora :
    Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs
    2001
  • Xuyuan, Jarle Andre, Arthur D. Van, Cora :
    On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies
    2000
  • Jarle Andre, Xuyuan, Arthur D. Van :
    Study of low-frequency noise in polycrystaline GexSi1-x
    2000
  • Xuyuan, Jarle Andre, Cora, Arthur D. Van :
    On Low-Frequency Noise Of Polycrystalline GeSi For Sub-Micron CMOS Technologies
    2000

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    Research interests

    Sensorteknologi

    Halvlederteknologi

    Teaching

    Elektronikk

    Reguleringsteknikk

    Industriell datakommunikasjon

    Programmering (LabVIEW)

    Teknologibygget Tromsø 4.011


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